CT440/CT440-PDL Optical Component Tester

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CT440/CT440-PDL Optical Component Tester

Compact tester for fast and accurate characterization of passive optical components (MUX/DEMUX, filters, splitters, etc.) and modules (ROADM, WSS). Covers the spectral range from 1240 to 1680 nm for measurements over the full telecom band. With the PDL option, simultaneously measure insertion loss and polarization dependent loss.

Key Features

Fast transfer function measurement

Wavelength range: 1240 - 1680 nm (SMF model)

PM and PDL options

Wavelength resolution: 1 to 250 pm

Wavelength accuracy: ±5 pm

Dynamic range: 65 dB in a single sweep

Combines up to four tunable lasers (SMF type)

Four internal detectors, expandable with synchronization

19-in rack compatible with 1U format

Applications

Photonic integrated circuit (PIC) testing
Wavelength selective switch testing
Optical filter testing
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